International Arcade Museum Library

***** DEVELOPMENT & TESTING SITE (development) *****

Star Tech Journal

Issue: 1995-January - Vol 16 Issue 11 - Page 8

PDF File Only

STAR* TECH
Journal
January 1995
CD
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STAR* TECH Journal
WELLS GARDNER
Your Source For:
KILLER INSTINCT
• Monthly Tech Journal
• Service Manuals
• Industry Test Equipment
• Indexing & Diagnostic Software
• Video Brighteners
• Coin-Op Mail List Rental
• Industry Bulletin Board
• Back Issues from 1979
FEY FAILURES
Jay Pollitt
Wells Gardner Electronics Corp.
Chicago, Illinois
PROBLEM
FET Failures in U2000 Killer Instinct Monitors.
CAUSE
A torroid choke was added to the U2000 monitor
used in Killer Instinct to pass FCC requirements.
This choke causes a voltage peak to occur across
diode D107 and FET QlOl which can exceed their
breakdown rating.
Orders accepted prepaid or Cod.
Phone:
Fax:
BBS:
609/662-1080
609/662-0537
610/251-9387
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MODIFICATION
If the monitor is working OK, it is recommended
that R108 be changed from .22 ohm to .47 ohm, 2
watt, 5% metal oxide type, when convenient. This
limits the amplitude of the pulse to safe levels.
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STAR*TECH Journal neither operates,
distributes nor manufactures coin-oper-
ated equipment. It's sole purpose for
being is to compile technical and infor-
mational data considered valuable for
dissemination to its paid subscribers.
Comments or suggestions pertaining to
this service are always welcome.
If either the FET or diode has failed, it is recom-
mended that both be changed along with R108.
Kn AVAILABLE
A kit of parts consisting of fuse, FET, diode, and
resistor can be obtained by calling Wells-Gardner
service department toll free: 800/336-6630.
~
NOTE
It is important to note that the FET failures in the
COIN SLOTS
U2000 occur only in the Killer Instincts. All other
U2000 are OK.
STAR* TECH JOURNAL' s NEW INDEXING SOFTWARE
• See back cover for additional information •
EXCITING NEW INDEX DATABASE PROGRAM.
Packaged with additional utilities
and cross-references!
AMER/CAIi COIII MACHIIIE EXPOSITION
Thursday, March 23 • Friday, March 24 • Saturday, March 25
Reno Sparks Convention Center • Reno, Nevada
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Future scanning projects are planned by the International Arcade Museum Library (IAML).