Star Tech Journal

Issue: 1981-February - Vol 2 Issue 12

6 _ _ _ _ _ _ _ _ _ _ _ S~~TECH
Microprocessor Troubleshooting
(Part 2)
Part 1 of this 3-part series covered "Logic Probes" and "Logic
Probe Applications."
SIGNAL INJECTION
Static measurements of a digital circuit with the logic probe
alone may not be enough to isolate a circuit fault. An open or
short may still result in a correct static condition. However,
the circuit will malfunction under dynamic conditions. A more
complete check can be made by applying a test signal to a
circuit and then observing the output with a logic probe.
Special signal injection equipment is necessary to meet the
needs of the low input impedance TTL logic circuits so
commonly used today. To see why this is necessary, let's
briefly review the operational characteristics of the output
circuitry of a TTL gate.
Figure 6 shows a typical output portion of a TTL logic gate
circuit. The totem pole output stage contributes to the fast
switching time of a TTL circuit but, at the same time, causes
some problems when injecting test signals. The transistors
conduct alternately, depending upon whether the circuit is in
the 1 or the zero state. As shown in Figure 7 A, when the
output stage is in the 1 state, 01 conducts and serves as the
source to all the gates connected to the output. When the
output stage is in the zero state, as shown in Figure 78, 02
conducts and serves as a current sink to all gates connected
to that output. Due to the fact that either 01 or 02 is
conducting heavily and both are directly connected to the
output, the signal lines in the TTL output circuit are of very low
impedance. This means that both the input and output
circuits of a TTL gate are of low impedance. Therefore,
conventional signal generators cannot properly drive the TTL
circuits, and other equipment had to be developed.
One of the devices develped for logic circuit signal injection is
the Hewlett-Packard 546 Logic Pulser. This is a digital pulse
generator contained in a probe of the same general appear-
ance of the logic probe. However, instead of indicator lamps,
the logic pulser has a pulse button. This pulse button is a
switch that is used to provide different types of output pulses
from the logic pulser. A variety of output signal configurations
is provided by tapping the pulse button a specified number of
times. Figure 8 lists the capabilities of the 546 Logic Pulser.
For example, if the pulse button on the logic pulser is tapped
once, a single output pulse is obtained. Holding the pulse
button down produces a continuous 100-Hertz pulse stream.
If the button is tapped once and then held, the logic pulser
develops a 100-pulse burst. Tapping the button twice and
then holding it causes a 10-Hertz pulse stream to be
produced. Tapping the button three times and then holding it
produces 10-pulse bursts. Tapping the button four times and
then holding itwill produce a 1-Hertzcontinuousstream. With
the variety of signals available, the integrated circuits in a
logic system can be stimulated and their outputs observed
under pulse conditions with a logic tracer.
GATE
OUTPUT
FIGURE 6
•o•
SOURCE
SINK
A
B
FIGURE 7
STATE
S~R-TECH __ _ _ __ _ _ _ _ _ 7
The manner of connecting the logic pulser into the circuit
under test is quite simple. The logic pulser has two power
leads that are connected to the Vee and ground points in the
circuit. Any DC voltage from +3 to +18 volts, with a current
capability of 35 mA, will cause the logic pulser to operate
properly. With the power leads connected, merely touch the
probe of the logic pulser to the desired point in the circuit and
generate a signal by tapping and pressing the pulse button as
previously described.
HEWLETT PACKARD
546 LOGIC PULSER
PULSE BUTTON
CODE
OUTPUT

SINGLE PULSE
·-
CONTINUOUS 100 Hz PULSE STREAM
100-PULSE BURST
. . . . -
10 Hz PULSE STREAM
10-PULSE BURST
1 Hz PULSE STREAM

ONE PRESS OF BUTTON
-
PRESS AND LATCH
FIGURE 8
The Hewlett-Packard 546 Logic Pulser automatically senses
the signal level at the test point and will drive a high level low
or a low level high to produce the pulse. It is overload
protected and is capable of delivering a 0.5 microsecond
pulse of approximately 650 milliamps. With a low output
impedance of approximately 2 ohms, the circuit can drive a
TTL line for any circuit condition except a direct short that is
less than two inches from the pulser probe. A short to ground
or Vee less than two inches from the probe presents a low
enough impedance to load down the probe'soutput. The logic
pulser eliminates the need to unsolder integrated circuit pins
or cut the foil on a printed circuito inject signals. Together
with the logic probe, it provides a valuable tool in trouble-
shooting integrated circuit systems.
Figure 9 shows a condition where the output of ICA is shorted
to ground. A static measurement of the circuit with the logic
probe alone might not indicate this fault, since it could very
well be a situation where that point in the circuit is normally at
a logic zero but must momentarily go high in response to a
short pulse. By connecting the logic pulser and the logic
probe to the same point, you would notice that the logic
pulser would be unable to drive the output of ICA above
ground and no pulse would be observed. The logic pulser is
designed so that it can drive a gate that is in either the 1 or the
zero state, but it is unable to drive a ground or a short to Vee
that is physically close to the probe.
LOGIC
PROBE
FAULT
FIGURE 9

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